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PRODUCT01

>PRODUCT>IT&T PRODUCT

INQUIRY
  • TEL : 031-8067-6991
  • E-MAIL : jhkoo@it-t.co.kr
이전제품
  • S200-STD
  • S200-ULC
  • S105TC
  • SV2T (In Line)
  • NEOS1-CHASSIS
  • NEOS2-CHASSIS
  • NEOS2 3C-System
  • NEOS2 4C-System
  • NEOS2 8C-System
  • NEOS3-CHASSIS
  • HADPS128-CHASSIS
  • S201TC
  • S102D
다음제품
  • S200-STD
  • S200-STD

    상세설명
    제품개요
    It will be able to satisfy the needs of various types of SOC products and also can construct instruments that are customer specialized through the application of open architecture.
    제품특징
    - Test Device AP, DDI, PMIC, SSD CONTROLLER, SMART IC
    - Channel 4,096 (IO)
    - Speed Up to 800Mbps
    - Dimension Power Unit : 800 x 835 x 2300, Test Header : 790 x 1350 x 990
    - Operating System Windows / Linux
  • S200-ULC
  • S200-ULC

    상세설명
    제품개요
    It will be able to satisfy the needs of various types of SOC products and can also construct instruments that are customer specialized through the application of open architecture.
    제품특징
    - Test Device AP, DDI, PMIC, SSD CONTROLLER, SMART IC
    - Channel 1,024 (IO)
    - Speed Up to 800Mbps
    - Dimension Power Unit : 800 x 835 x 2300, Test Header : 800 x 1300 x 875
    - Operating System Windows / Linux
  • S105TC
  • S105TC

    상세설명
    제품개요
    It is NAND FLASH Test equipment with high speed
    제품특징
    - Test Device FLASH(Optimized for NAND FLASH), DRAM, eMMC, MCP
    - Parallelism Up to 640Para
    - Speed Up to 1.6Gbps (TBD 2.4Gbps)
    - Temperature -40℃ ~ 125℃
    - Dimension 2500 x 1850 x 2100
    - Operating System Windows10 64bits
  • SV2T (In Line)
  • SV2T (In Line)

    상세설명
    제품개요
    This is one of the equipments that can be BIST-tested by a continuous array of SSD products through the UART interface. It will be able to test M.2, U.2, E1.S, E3.S, SATA, and SAS products independently from Formfactor.
    제품특징
    - Test Device SSD
    - Parallelism 2,400 (per Handler)
    - Temperature 25℃ ~ 60℃
    - Dimension Handler : 3030 x 1600 x 2630, Loader : 2040 x 1580 x 1920, UnLoader : 2040 x 980 x 1950
    - Operating System Windows / Linux
  • NEOS1-CHASSIS
  • NEOS1-CHASSIS

    상세설명
    제품개요
    It can test all types of memory products. It is very small in size and suitable for laboratory applications and can be expanded indefinitely. It is available for DC & Gross Function defect detection purposes before Burn-in Test and is suitable for memory DIE pre-defect detection before manufacturing composite chips
    제품특징
    - Test Device DRAM, NAND Flash, LPDDR, eMMC, UFS, HBM
    - Parallelism Up to 16Para
    - Speed Up to 400Mbps
    - Dimension 450 x 700 x 195
    - Operating System Windows / Linux
  • NEOS2-CHASSIS
  • NEOS2-CHASSIS

    상세설명
    제품개요
    It can test all types of memory products. It is very small in size and suitable for laboratory applications and can be expanded indefinitely. It is available for DC & Gross Function defect detection purposes before Burn-in Test and is suitable for memory DIE pre-defect detection before manufacturing composite chips.
    제품특징
    - Test Device DRAM, NAND Flash, LPDDR, eMMC, UFS, HBM
    - Parallelism Up to 8Para
    - Speed Up to 800Mbps
    - Dimension 560 x 600 x 195
    - Operating System Windows / Linux
  • NEOS2 3C-System
  • NEOS2 3C-System

    상세설명
    제품개요
    NEOS2-based extension product.Equipment that increases test reliability by supporting the Source SYNC method.
    제품특징
    - Test Device DRAM, NAND Flash, LPDDR, eMMC, UFS, HBM
    - Parallelism Up to 24Para
    - Speed Up to 800Mbps
    - Dimension 1075 x 1345 x 950
    - Operating System Windows / Linux
  • NEOS2 4C-System
  • NEOS2 4C-System

    상세설명
    제품개요
    NEOS2-based extension product. Equipment that increases test reliability and improves mass production by supporting the Source SYNC method.
    제품특징
    - Test Device DRAM, NAND Flash, LPDDR, eMMC, UFS, HBM
    - Parallelism Up to 128Para (4-Share)
    - Speed Up to 400Mbps
    - Dimension 1500 x 1240 x 1000
    - Operating System Windows / Linux
  • NEOS2 8C-System
  • NEOS2 8C-System

    상세설명
    제품개요
    NEOS2-based extension product. Equipment that increases test reliability and improves mass production by supporting the Source SYNC method.
    제품특징
    - Test Device DRAM, NAND Flash, LPDDR, eMMC, UFS, HBM
    - Parallelism Up to 512Para (8-Share)
    - Speed Up to 200Mbps
    - Dimension 910 x 900 x 1995
    - Operating System Windows / Linux
  • NEOS3-CHASSIS
  • NEOS3-CHASSIS

    상세설명
    제품개요
    Neos3 is equipment that has extensive test-capacity to be able to test between the core-test and mid-band test. Also, it can combine with the customer's test mode for merging the speed test.
    제품특징
    - Test Device NAND, DRAM, LPDDR, HBM, UFS
    - Parallelism
    - Speed
    - Dimension
    - Operating System
  • HADPS128-CHASSIS
  • HADPS128-CHASSIS

    상세설명
    제품개요
    TBD
    제품특징
    - Test Device
    - Parallelism
    - Speed
    - Dimension
    - Operating System
  • S201TC
  • S201TC

    상세설명
    제품개요
    To detect potential defects in the device product in the early stage, this device is tested by applying thermal stress to the device at high temperatures and low temperatures (-40°C to 125°C). This is a burn-in test equipment that performs over stress with temperature, current, and voltage for a long time by applying electrical conditions, such as voltage, current, etc., which are higher than actual use conditions to improve reliability when the device is used. It also supports the CON-CURRENT TEST function, which simultaneously tests the LPDDRx of eMCP with eMMC.
    제품특징
    - Test Device FLASH(Optimized for NAND FLASH), DRAM, eMMC, MCP
    - Parallelism Up to 768Para
    - Speed Up to 1.6Gbps
    - Temperature -40℃ ~ 125℃
    - Dimension 1390 x 1700 x 2550
    - Operating System Windows / Linux
  • S102D
  • S102D

    상세설명
    제품개요
    This is one of the equipments that can be BIST- Test, by SSD products through the UART interface. It supports BIB for the type of M.2, E1.S and E3.S and it can logistics automation process.
    제품특징
    - Test Device SSD
    - Parallelism 2,400
    - Temperature 35℃ ~ 85℃
    - Dimension Chamber : 3260 x 2400 x 2480
    - Operating System Linux